The course gives the unique opportunity within the Master course in Electronics Engineering to familiarize with the growing field of semiconductor radiation detection. Those systems are nowadays used in challenging fundamental and applied research and in industrial applications with an increasing demand for experts in the field. The course provides deep understanding of the physical principles and ultimate performances of the main types of semiconductor detectors aiming at the measurement of diverse properties (e.g. energy, time, position, imaging) of the incident radiation (X and gamma rays, visible photons, charged particles, etc.). The program covers basic and advanced detectors presently in use in a variety of scientific and technological fields and the more recent challenges and developments. The course includes in-depth analysis of selected case studies, both in class and in the laboratory, also with contributions from international experts. A visit to an international scientific center with relevant activities in the development of detection systems will be possibly organized during the semester. 

- knowledge of the main topics in the field of radiation detection systems. In particular the student will gain deep understanding in: i) main types of radiation interaction with matter, ii) principle of operation of different semiconductor detector topologies for imaging and spectroscopy, iii) mechanisms of signal formation and iv) low noise readout architectures (DD1).

- analysis of the main parameters governing the interaction of X-ray photons with a sample or with a detector, use of public cross-section databases, computation of detected signal shapes in specific detector topologies, analysis of the expected performance of a radiation detection system coupled with its frontend electronics (DD1 and DD2).

- ability to communicate the knowledge acquired in specific activities (e.g. laboratory sessions, topical seminars or scientific papers/guided visit) on cases of real detection systems using the appropriate scientific terminology and the descriptors of the main concepts in the field (DD1 and DD4).

1. Interaction of radiation with matter: photons and charged particles, mean creation energy, statistical fluctuations.

2. Semiconductors as radiation detectors: charge transport, generation-recombination, charge multiplication mechanisms, trapping.

3. Signal formation in radiation detectors: Shockley-Ramo's theorem, computation of induced current shapes in relevant case studies.

4. Semiconductor detectors for energy and position measurement of X-rays, gamma-rays, charged particles: microstrip detectors, pixel detectors, semiconductor drift detectors for spectroscopy and position-sensing, non-silicon detectors.

5. Readout electronics: low-noise architectures and processing techniques.

6. Imaging pixel sensors: Charge Coupled Devices (CCD), CMOS monolithic active pixel sensors.

7. Advanced detector-amplification structures.

8. Examples of detection systems for frontier applications: synchrotron light experiments, astrophysics, diagnostic imaging, high energy physics experiments, etc.

Laboratory activities

Laboratory activities aim at making students more familiar with practical detection systems and with the main instrumental facilities of a detector laboratory. Students will tackle realistic detector design problems and will conduct experiments on detection systems with X-rays and measure the performance of low-noise readout electronics. 

Other activities

Topical seminars from experts in the field and/or assignment of topical papers and/or a visit to an international scientific center will be possibly organized during the semester on a year by year basis in order to introduce cases of real detection systems and/or advanced topics.  

Calculus and differential equations. Electromagnetic field and Maxwell equations. Semiconductor devices: energy band representation, pn junction, metal-semiconductor contact, transistors. Basic amplifying stages.

The evaluation is in the form of an oral interview. The interview is intended to evaluate and assess:

- the level of understanding of the main topics in the field of semiconductor radiation detectors and of the related readout, specifically: the main types of radiation interaction with matter, the fundamental detector topologies for imaging and spectroscopy, the formation of the electrical signals in detectors, the low noise architectures mainly used for the readout (Dublin Descriptor 1).

- the level of understanding of the principle operation of the different detector topologies and of the techniques to analyse the shape and properties of detected signals.(Dublin Descriptor 1 and 2).

- the analysis of the expected performance of a radiation detection system coupled with its frontend electronics.(Dublin Descriptor 1 and 2).

- the application of the knowledge in the field to choose the most suited topology of detector for a given application and the ability to make numerical estimates and derivations.(Dublin Descriptor 2).

- ability to communicate the knowledge of real cases of detection systems acquired in specific course activities with a critical approach in the discussion. (Dublin Descriptor 1 and 4).

E-book available at www.biblio.polimi.it

Suggested readings will be made available during the course